The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2012

Filed:

Jan. 10, 2008
Applicant:

Masatoshi Tokushima, Tokyo, JP;

Inventor:

Masatoshi Tokushima, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided an optical control device including a plurality of line-defect waveguides provided in a photonic crystal; each line-defect waveguide including a multiplicity of dielectric pillars with a finite height arranged at lattice points of a two-dimensional Bravais lattice. The optical control device comprises: a first line-defect waveguide; a second line-defect waveguide provided with the dielectric pillars having a thickness different from that of the dielectric pillars of the first line-defect waveguide; and a third line-defect waveguide arranged between the first and second line-defect waveguides and provided with the dielectric pillars whose thicknesses are gradually varied from those of the dielectric pillars of the first line-defect waveguide to those of the dielectric pillars of the second line-defect waveguide along a wave guiding direction.


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