The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2012
Filed:
May. 15, 2007
Kazuyuki Sakurai, Tokyo, JP;
Kazuyuki Sakurai, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
A recognition system of this invention has feature point detection means (), Hough transform means (), and specific pattern output means (). In the Hough transform means (), a Hough space is designed so that a magnitude relation of a distance between points in the Hough space is equivalent to a predetermined magnitude relation of an inter-specific-pattern distance indicative of a difference between specific patterns. The recognition system detects the specific patterns using the Hough space. By adopting such a structure to express more similar specific patterns in an image as closer points also in the Hough space, it is possible to achieve an object of this invention.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile