The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2012
Filed:
Feb. 27, 2008
Chi-chung Lau, Taipei, TW;
Jin-king Liu, Hsinchu, TW;
Kuo-hsin Hsiao, Hsinchu, TW;
Ta-ko Chen, cyong lin Township, Hsinchu County, TW;
Jiann-yeou Rau, Pingjhen, TW;
Yi-chen Shao, Miaoli, TW;
Liang-chien Chen, Pingjhen, TW;
Chi-Chung Lau, Taipei, TW;
Jin-King Liu, Hsinchu, TW;
Kuo-Hsin Hsiao, Hsinchu, TW;
Ta-Ko Chen, cyong lin Township, Hsinchu County, TW;
Jiann-Yeou Rau, Pingjhen, TW;
Yi-Chen Shao, Miaoli, TW;
Liang-Chien Chen, Pingjhen, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A method and system for target detecting, editing and rebuilding by 3D image is provided, which comprises an inputting and picking unit, a training and detecting unit, a displaying and editing unit and a rebuilding unit. The inputting and picking unit receives a digital image and a LiDAR data and picks up a first parameter to form a 3D image. The training and detecting unit selects a target, picks up a second parameter therefrom, calculates the second parameter to generate a threshold and detects the target areas in the 3D image according to the threshold. The displaying and editing unit sets a quick selecting tool according to the threshold and edits the detecting result. The rebuilding unit sets a buffer area surrounding the target, picks up a third parameter therefrom and calculates the original shape of the target by the Surface Fitting method according to the third parameter.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile