The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8208400 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 26, 2012

Filed:

Sep. 01, 2009
Applicants:

Wen-yi Wu, Shenzhen, CN;

Xiao-fei Liu, Shenzhen, CN;

Wen Deng, Shenzhen, CN;

Inventors:

Wen-Yi Wu, Shenzhen, CN;

Xiao-Fei Liu, Shenzhen, CN;

Wen Deng, Shenzhen, CN;

Assignees:

Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;

Hon Hai Precision Industry Co., Ltd., Tu-Cheng, New Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for testing a wireless connection of an electronic device includes the following steps. The electronic device is initialized to a stand-by state. A testing server connects the electronic device to form a wireless connection based on a wireless protocol. The testing server outputs a plurality of first data packages to the electronic device and receives a plurality of second data packages from the electronic device to test a rate of data throughput via the wireless connection by the testing server. A wake-up signal is sent to the electronic device via the wireless connection to the electronic device.


Find Patent Forward Citations

Wu, Wen-Yi. (2012). Method for testing wireless connection of electronic device (U.S. Patent No. 8208400). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8208400

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