The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2012
Filed:
Jul. 20, 2006
Valentina Alaria, San Francisco, CA (US);
Silvano Gai, San Jose, CA (US);
Thomas Edsall, Cupertino, CA (US);
Varagur V. Chandrasekaran, Fremont, CA (US);
Valentina Alaria, San Francisco, CA (US);
Silvano Gai, San Jose, CA (US);
Thomas Edsall, Cupertino, CA (US);
Varagur V. Chandrasekaran, Fremont, CA (US);
Cisco Technology, Inc., San Jose, CA (US);
Abstract
A metric measurement mechanism is used to determine network characteristics such as latency and round trip time with more precision than that available from layer three metric measurement mechanisms. The metric measurement mechanism can use the same architecture used by layer three metric measurement mechanisms while more accurately measuring network latency and isolating network device processing delays.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile