The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2012

Filed:

Feb. 02, 2009
Applicants:

Nobuyuki Satoh, Kanagawa, JP;

Hiroshi Takahashi, Kanagawa, JP;

Masato Kobayashi, Kanagawa, JP;

Yuichi Sakurada, Tokyo, JP;

Akito Yoshimaru, Kanagawa, JP;

Yasuo Sakurai, Kanagawa, JP;

Inventors:

Nobuyuki Satoh, Kanagawa, JP;

Hiroshi Takahashi, Kanagawa, JP;

Masato Kobayashi, Kanagawa, JP;

Yuichi Sakurada, Tokyo, JP;

Akito Yoshimaru, Kanagawa, JP;

Yasuo Sakurai, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/04 (2006.01); G06K 9/36 (2006.01); G09G 3/16 (2006.01); B41J 2/435 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image reading apparatus is disclosed that includes plural line image sensors partially overlapped with each other in an overlapped reading portion, the image reading apparatus characterized by: plural light sources disposed so as to face the overlapped reading portion; a light source turn-on unit sequentially and independently turning on the light sources; an optical unit converging each light emitted from the light sources onto the overlapped reading portion; and a position shift detecting unit detecting a position shift of a reading position of the line image sensors in the overlapped reading portion based on data of the overlapped reading portion.


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