The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2012

Filed:

Jul. 20, 2007
Applicants:

Hauke Lengsfeld, Helmste, DE;

Peter Sander, Bremen, DE;

Hans Marquardt, Fredensberg, DE;

Rudolf Duwald, Bremervoerde, DE;

Inventors:

Hauke Lengsfeld, Helmste, DE;

Peter Sander, Bremen, DE;

Hans Marquardt, Fredensberg, DE;

Rudolf Duwald, Bremervoerde, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method for determining at least one characteristic parameter of a CRP specimen (), in particular a specimen of prepreg material, for aerospace, comprising the following method steps: presenting the specimen (), irradiating the. specimen () with a predetermined spectrum of electromagnetic radiation, recording the interaction between the specimen () and the electromagnetic radiation in a data record () and determining the at least one characteristic parameter from the recorded data record ().


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