The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2012

Filed:

May. 18, 2009
Applicants:

Marc Mignard, Berkeley, CA (US);

Clarence Chui, San Mateo, CA (US);

Mithran C. Mathew, Mountain View, CA (US);

Jeffrey B. Sampsell, San Jose, CA (US);

Inventors:

Marc Mignard, Berkeley, CA (US);

Clarence Chui, San Mateo, CA (US);

Mithran C. Mathew, Mountain View, CA (US);

Jeffrey B. Sampsell, San Jose, CA (US);

Assignee:

QUALCOMM MEMS Technologies, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 3/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for sensing the actuation and/or release voltages of a electromechanical system or a microelectromechanical device include applying a varying voltage to the device and sensing its state and different voltage levels. In one embodiment, the device is part of a system comprising an array of interferometric modulators suitable for a display. The method can be used to compensate for temperature dependent changes in display pixel characteristics.


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