The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8207501 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 26, 2012

Filed:

Jan. 16, 2009
Applicants:

Takashi Katagiri, Sendai, JP;

Takeaki Itsuji, Hiratsuka, JP;

Inventors:

Takashi Katagiri, Sendai, JP;

Takeaki Itsuji, Hiratsuka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for measuring a terahertz wave includes a dispersing sectionfor chirping the terahertz wavegenerated from a generating section. A detecting sectiondetects waveform information on the terahertz wave chirped by the dispersing section. As a result, it is possible to acquire frequency information included in the waveform information. Therefore, it is possible to acquire spectral information including amplitude information of each frequency component and intensity information on each frequency or wavelength from the time waveform without Fourier-transforming the time waveform.


Find Patent Forward Citations

Katagiri, Takashi. (2012). Apparatus and method for measuring terahertz wave (U.S. Patent No. 8207501). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8207501

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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