The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2012
Filed:
Apr. 20, 2010
Darryl Meister, Olathe, KS (US);
Timo Kratzer, Aalen, DE;
Jesús Miguel Cabeza Guillén, Aalen, DE;
Ray Steven Spratt, Petaluma, CA (US);
Markus Welscher, Aalen, DE;
Gerhard Kelch, Aalen, DE;
Helmut Wietschorke, Aalen, DE;
Darryl Meister, Olathe, KS (US);
Timo Kratzer, Aalen, DE;
Jesús Miguel Cabeza Guillén, Aalen, DE;
Ray Steven Spratt, Petaluma, CA (US);
Markus Welscher, Aalen, DE;
Gerhard Kelch, Aalen, DE;
Helmut Wietschorke, Aalen, DE;
Carl Zeiss Vision Inc., Petaluma, CA (US);
Carl Zeiss Vision GmbH, Aalen, DE;
Abstract
The current invention is directed to a method for designing an ophthalmic lens element, the method comprising the steps of determining a wavefront aberration of an eye in a reference plane, wherein the wavefront aberration of the eye can be described by a first series of polynomials of ascending order up to a first specific order and corresponding first coefficients; determining a first vision correction of a second specific order; determining at least one specific point over an aperture of the adapted ophthalmic lens element; determining a high-order wavefront aberration in the reference plane for each specified point of the adapted ophthalmic lens element, wherein the high-order wavefront aberration can be described by a third series of polynomials of ascending order above the second specific order up to and including the first specific order and corresponding third coefficients; and determining a second vision correction of the second specific order.