The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2012

Filed:

Apr. 23, 2007
Applicants:

Adam K. Kolawa, Bradbury, CA (US);

Wayne P. Ariola, Jr., Los Angeles, CA (US);

Marek Michal Pilch, Durate, CA (US);

Inventors:

Adam K. Kolawa, Bradbury, CA (US);

Wayne P. Ariola, Jr., Los Angeles, CA (US);

Marek Michal Pilch, Durate, CA (US);

Assignee:

Parasoft Corporation, Monrovia, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for assessing effect of a change in a computer software including a plurality of requirements and a plurality of test cases. The method and system include: changing a requirement from the plurality of requirements; correlating the computer software with the changed requirement to identify a portion of the computer software that is affected by the changed requirement; and correlating one or more of the test cases with the portion of the computer software that is affected to identify one or more of the test cases that is affected by the changed requirement. Additionally, the computer software may be changed and the effect of that change on the requirements and the test cases may then be determined.


Find Patent Forward Citations

Loading…