The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2012
Filed:
Dec. 09, 2008
Guillaume Bouchard, Crolles, FR;
Jean-marc Andreoli, Meylan, FR;
Guillaume Bouchard, Crolles, FR;
Jean-Marc Andreoli, Meylan, FR;
Xerox Corporation, Norwalk, CT (US);
Abstract
An events analysis method comprises: optimizing respective to a set of training data a set of branching transition likelihood parameters associating parent events of type k with child events of type k' in branching processes; inferring a most probable branching process for a set of input data comprising events based on the optimized set of branching transition likelihood parameters; and identifying rare or unusual events of the set of input data based on the inferred most probable branching process. An events analysis apparatus includes a probabilistic branching process learning engine configured to optimize the set of branching transition likelihood parameters, and a probabilistic branching process inference engine configured to infer the most probable branching process.