The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2012

Filed:

Feb. 14, 2008
Applicants:

Hugues H Hoppe, Redmond, WA (US);

Yonatan Wexler, Redmond, WA (US);

Eyal Ofek, Redmond, WA (US);

Huamin Wang, Atlanta, GA (US);

Inventors:

Hugues H Hoppe, Redmond, WA (US);

Yonatan Wexler, Redmond, WA (US);

Eyal Ofek, Redmond, WA (US);

Huamin Wang, Atlanta, GA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); G06T 7/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and/or methods that factor large-scale repeated content within and/or among images can include devices and components that factor received or acquired images into epitomes that include all the content of the received or acquired images and transform maps that encode how to construct a facsimile or a close approximation of the image by selecting transformed regions from the epitomes. Through use of both the epitomes and the transform maps in conjunction, a facsimile or a close approximation of the input image can be reconstructed and displayed.


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