The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2012
Filed:
Mar. 14, 2011
Paul A. Larsen, Midland, MI (US);
James B. Rawlings, Madison, WI (US);
Nicola J. Ferrier, Madison, WI (US);
Paul A. Larsen, Midland, MI (US);
James B. Rawlings, Madison, WI (US);
Nicola J. Ferrier, Madison, WI (US);
Wisconsin Alumni Research Foundation, Madison, WI (US);
Abstract
An image containing one or more types of objects to be located is analyzed to locate linear features within the image. The objects have edges having known spatial relationships. The linear features and identified virtual lines are analyzed to find groups of linear features and/or virtual lines that have one of the known spatial relationships. These relationships can include parallel edges, edges that meet at certain angles or angle ranges, the number of lines meeting a vertex and the like. The identified group is compared with projected 2-dimensional representation(s) of the object(s) to determine whether any additional lines appear in the image that are part of the located object. In various exemplary embodiments, two or more hypotheses for how the identified group of linear features maps to the 3-dimensional representation of the object can be generated. The best fitting hypothesis becomes the recognized 3-dimensional shape and orientation for that object.