The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2012
Filed:
Feb. 19, 2010
Dean Connor, Brooklyn, NY (US);
Christopher Parham, Raleigh, NC (US);
Etta Pisano, Chapel Hill, NC (US);
Waldo S. Hinshaw, Burlingame, CA (US);
Zhong Zhong, Stony Brook, NY (US);
Brian P. Wilfley, Los Altos, CA (US);
Dean Connor, Brooklyn, NY (US);
Christopher Parham, Raleigh, NC (US);
Etta Pisano, Chapel Hill, NC (US);
Waldo S. Hinshaw, Burlingame, CA (US);
Zhong Zhong, Stony Brook, NY (US);
Brian P. Wilfley, Los Altos, CA (US);
Nextray, Inc., Chapel Hill, NC (US);
Abstract
Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources are disclosed. A plurality of monochromator crystals may be positioned to intercept the plurality of first X-ray beams such that a plurality of second X-ray beams each having predetermined energy levels is produced. Further, an object to be imaged may be positioned in paths of the second x-ray beams for transmission of the second X-ray beams through the object and emitting from the object a plurality of transmission X-ray beams. The X-ray beams may be directed at angles of incidence upon a plurality of analyzer crystals for detecting an image of the object.