The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2012

Filed:

Jul. 16, 2009
Applicants:

Luke Tilman Peterson, Oakland, CA (US);

James Alexander Mccombe, San Francisco, CA (US);

Ryan R. Salsbury, San Francisco, CA (US);

Inventors:

Luke Tilman Peterson, Oakland, CA (US);

James Alexander McCombe, San Francisco, CA (US);

Ryan R. Salsbury, San Francisco, CA (US);

Assignee:

Caustic Graphics, Inc., San Francisco, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

For ray tracing scenes composed of primitives, systems and methods can traverse rays through an acceleration structure. The traversal can be implemented by concurrently testing a plurality of nodes of the acceleration structure for intersection with a sequence of one or more rays. Such testing can occur in a plurality of test cells. Leaf nodes of the acceleration structure can bound primitives, and a sequence primitives can be tested concurrently for intersection in the test cells against a plurality of rays that have intersected a given leaf node. Intersection testing of a particular leaf node can be deferred until a sufficient quantity of rays have been collected for that node.


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