The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8203351 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 19, 2012

Filed:

May. 19, 2010
Applicants:

Benjamin N. Eldridge, Danville, CA (US);

Carl V. Reynolds, Pleasanton, CA (US);

Takao Saeki, Yokohama, JP;

Yoichi Urakawa, Higashimurayama, JP;

Inventors:

Benjamin N. Eldridge, Danville, CA (US);

Carl V. Reynolds, Pleasanton, CA (US);

Takao Saeki, Yokohama, JP;

Yoichi Urakawa, Higashimurayama, JP;

Assignee:

FormFactor, Inc., Livermore, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A probing apparatus can comprise a substrate, conductive signal traces, probes, and electromagnetic shielding. The substrate can have a first surface and a second surface opposite the first surface, and the electrically conductive first signal traces can be disposed on the first surface of the first substrate. The probes can be attached to the first signal traces, and the electromagnetic shielding structures can be disposed about the signal traces.


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Eldridge, Benjamin. (2012). Probing apparatus with guarded signal traces (U.S. Patent No. 8203351). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8203351

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