The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2012
Filed:
Aug. 19, 2008
Hans-peter Hohe, Heiligenstadt, DE;
Michael Hackner, Hemau Ot Haag, DE;
Markus Stahl-offergeld, Erlangen, DE;
Hans-Peter Hohe, Heiligenstadt, DE;
Michael Hackner, Hemau Ot Haag, DE;
Markus Stahl-Offergeld, Erlangen, DE;
Abstract
A calibratable magnetic field sensor for sensing a first and a second spatial component of a magnetic field in a reference point, wherein the magnetic field includes a first and a second measurement field component and/or a first and a second calibration field component. The magnetic filed sensor includes a first sensor element arrangement including at least a first and a second sensor element for sensing the first magnetic field component, which includes a first measurement field component and/or a first calibration field component, with respect to a first spatial axis in the reference point. Furthermore, the magnetic field sensor includes a second sensor element arrangement for sensing the second magnetic field component, which includes a second measurement field component and/or a second calibration field component, with respect to a second spatial axis in the reference point. The magnetic filed sensor also includes an excitation line arranged with respect to the first sensor element arrangement so that, when impressing a default current into the excitation line, a pair of different asymmetrical default calibration field components in the first sensor element and in the second sensor element is generated with respect to the first spatial axis in the first sensor element arrangement, wherein the two spatial axes pass along linearly independent position vectors.