The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2012
Filed:
Apr. 22, 2008
Martin Suntinger, Vienna, AT;
Hannes Obweger, Klagenfurt, AT;
Christian Rauscher, Lichtenau, AT;
Josef Schiefer, Vienna, AT;
Martin Suntinger, Vienna, AT;
Hannes Obweger, Klagenfurt, AT;
Christian Rauscher, Lichtenau, AT;
Josef Schiefer, Vienna, AT;
UC4 Software GmbH, Wolfsgraben, AT;
Abstract
A method of detecting a reference sequence of events in a sample sequence of events, wherein each event is of a certain event type and holds a set of data attributes, includes the steps of: picking candidate combinations of events from said sample sequence so that the event types within each candidate combination match the event types in the reference sequence, calculating an overall similarity score for each candidate combination from at least (i) an event occurrence score based on occurrence deviations of the events of a candidate combination with respect to the matching events of the reference sequence and (ii) an attribute match score based on similarity deviations between the data attributes of the events of a candidate combination and the data attributes of the matching events of the reference sequence, and identifying the candidate combination with the best overall similarity score as reference sequence detected.