The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2012
Filed:
Sep. 21, 2007
Bishwaranjan Bhattacharjee, Yorktown Heights, NY (US);
Christian A. Lang, New York, NY (US);
Timothy R. Malkemus, Leander, TX (US);
Bishwaranjan Bhattacharjee, Yorktown Heights, NY (US);
Christian A. Lang, New York, NY (US);
Timothy R. Malkemus, Leander, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An index scan processor and method to perform concurrent scans of stored indexed data. An indexed data scanner performs a first scan of stored data by sequentially scanning through an index data structure and maintains, over a duration of the first scan, a first scan current scan location within the index data structure that indicates a currently accessed record within the stored data structure for the first scan. A scan manager accepts a request for a second scan of the stored data, determines, during the performing the first scan, a starting index scan location within the index data structure for the second scan that is sufficiently near the first scan current index scan location to cause records indicated by the starting location index to be stored within a buffer due to the performing the first scan, and starts the second scan at the starting location and proceeding to the second end key.