The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2012
Filed:
Nov. 02, 2007
Stephen David Gibson, Kemptville, CA;
Andrew Alexander Leikucs, Ottawa, CA;
Stewart James Winter, Metcalfe, CA;
Stephen David Gibson, Kemptville, CA;
Andrew Alexander Leikucs, Ottawa, CA;
Stewart James Winter, Metcalfe, CA;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and a system for analyzing a data value of interest in a multidimensional database. The data value of interest is first identified in a structured report. The data source for the structured report is retrieved. A context for the data value of interest in the data source is collected, for example, by extracting a slicer from the structured report, by extracting members of master-detail pages, or by extracting a default measure from the structured report. An analysis specification based on the collected context is then built, and the data value of interest is analyzed using the analysis specification. The result from analyzing the data value of interest may be presented in an analysis view.