The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2012
Filed:
Oct. 19, 2010
Chen-fu Chien, Hsinchu, TW;
Chih-han HU, Kaohsiung, TW;
Chen-Fu Chien, Hsinchu, TW;
Chih-Han Hu, Kaohsiung, TW;
National Tsing Hua University, Hsinchu, TW;
Abstract
A factor analysis system and method thereof is disclosed. The factor analysis system comprises a data receiving module for receiving a plurality of factors having influence on a target total value, a plurality of base values corresponding to the factors, and a target improvement percentage; a first computing unit for computing a reference target total value and a plurality of upgraded target total values; a second computing unit using the upgraded target total values and the reference target total value to compute the sensitivity of each of the factors; and a processing module for multiplying a factor improvement of each factor in percentage point by the factor sensitivity of each factor to obtain the level of contribution of each factor to the target total value. Through the factor analysis, a decision maker can decide the optimal combination of different factor improvements for achieving the planned target total value.