The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8200474 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 12, 2012

Filed:

Mar. 04, 2009
Applicants:

Chao Wang, Plainsboro, NJ (US);

Aarti Gupta, Princeton, NJ (US);

Inventors:

Chao Wang, Plainsboro, NJ (US);

Aarti Gupta, Princeton, NJ (US);

Assignee:

NEC Laboratories America, Inc., Princeton, NJ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for dynamic data race detection for concurrent systems includes computing lockset information using a processor for different components of a concurrent system. A controlled execution of the system is performed where the controlled execution explores different interleavings of the concurrent components. The lockset information is used during the controlled execution to check whether a search subspace associated with a state in the execution is free of data races. A race-free search subspace is dynamically pruned to reduce resource usage.


Find Patent Forward Citations

Wang, Chao. (2012). Dynamic model checking with property driven pruning to detect race conditions (U.S. Patent No. 8200474). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8200474

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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