The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2012
Filed:
Jun. 13, 2007
Josh N. Hogan, Los Altos, CA (US);
Carol Jean Wilson, San Jose, CA (US);
Josh N. Hogan, Los Altos, CA (US);
Carol Jean Wilson, San Jose, CA (US);
Abstract
A non-invasive imaging and analysis system suitable for measuring attributes of a target, such as the blood glucose concentration of tissue, includes an optical processing system which provides a probe and reference beam. It also includes a means that applies the probe beam to the target to be analyzed, combines the probe and reference beams interferometrically and detects concurrent interferometric signals. The invention includes fitting multiple sets of concurrently acquired data to a profile template and calculating a variance between the profile template and the acquired data sets. It further includes refining the profile template to minimize the variance between at least some of the concurrently acquired data sets to generate a refined profile, correlating the refined profile with data from a data bank stored in memory and processing resulting correlation data to determine an attribute of the target.