The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2012
Filed:
Jun. 18, 2009
Kohji Ue, Ebina, JP;
Yasushi Nakazato, Tokyo, JP;
Osamu Satoh, Sagamihara, JP;
Masahide Yamashita, Tokyo, JP;
Jun Yamane, Yokohama, JP;
Kohji Ue, Ebina, JP;
Yasushi Nakazato, Tokyo, JP;
Osamu Satoh, Sagamihara, JP;
Masahide Yamashita, Tokyo, JP;
Jun Yamane, Yokohama, JP;
Ricoh Company, Limited, Tokyo, JP;
Abstract
A system abnormality determining method comprises the steps of transmitting fake abnormal information representing an abnormal condition of the target instrument from the target instrument to a condition determination device via a network during a test operation of the target instrument instead of condition information, determining if the condition determination device can determine the target instrument as being abnormal based on the fake abnormal information, and operating the target instrument in a normal operation condition when the condition determination device can determine the target instrument as being abnormal.