The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2012

Filed:

Dec. 02, 2009
Applicants:

Arkady Kaplan, Rockville, MD (US);

Isaac Shpantzer, Bethesda, MD (US);

Inventors:

Arkady Kaplan, Rockville, MD (US);

Isaac Shpantzer, Bethesda, MD (US);

Assignee:

CeLight, Inc., Silver Spring, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/00 (2006.01); G08B 13/00 (2006.01); G01J 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for a structure monitoring and locating a disturbance event is disclosed. The system includes a compact transceiver chip sending optical signals in three optical fibers that encompass the monitored structure appropriately. The system contains a sequence of loops, wherein the first and the second fiber forming the loop clockwise, while the third fiber is winded along the same loop counterclockwise. A set of two detectors registers the returning signals, and a time delay between those signals is calculated, which is indicative of the disturbance event location. The event location is determined with different sensitivity in different parts of the monitored structure depending on the density of fibers in these parts.


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