The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2012
Filed:
May. 07, 2010
Applicants:
Kailash Krishnaswamy, Little Canada, MN (US);
Jan Lukas, Melnik, CZ;
Ondrej Kotaba, Orlova, CZ;
Inventors:
Assignee:
Honeywell International Inc., Morristown, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of extracting a feature from a point cloud comprises receiving a three-dimensional (3-D) point cloud representing objects in a scene, the 3-D point cloud containing a plurality of data points; generating a plurality of hypothetical features based on data points in the 3-D point cloud, wherein the data points corresponding to each hypothetical feature are inlier data points for the respective hypothetical feature; and selecting the hypothetical feature having the most inlier data points as representative of an object in the scene.