The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2012

Filed:

Jan. 21, 2009
Applicants:

Akihiro Watanabe, Aichi-ken, JP;

Noriaki Shirai, Kariya, JP;

Satoshi Osanai, Kariya, JP;

Inventors:

Akihiro Watanabe, Aichi-ken, JP;

Noriaki Shirai, Kariya, JP;

Satoshi Osanai, Kariya, JP;

Assignee:

Denso Corporation, Kariya, Aichi-Pref., JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06K 9/56 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a system for detecting a target object, a similarity determining unit sets a block in a picked-up image, and compares a part of the picked-up image contained in the block with a pattern image data while changes a location of the block in the picked-up image to determine a similarity of each part of the picked-up image contained in a corresponding one of the different-located blocks with respect to the pattern image data. A specifying unit extracts some different-located blocks from all of the different-located blocks. The determined similarity of the part of the picked-up image contained in each of some different-located blocks is equal to or greater than a predetermined threshold similarity. The specifying unit specifies, in the picked-up image, a target area based on a frequency distribution of some different-located blocks therein.


Find Patent Forward Citations

Loading…