The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2012
Filed:
Apr. 10, 2008
Walter Schoenmaekers, Tielt-winge, BE;
Luc Van Hoorebeke, Ghent, BE;
Bert Masschaele, Kemmel, BE;
Veerle Cnudde, Nukerke, BE;
Manuel Dierick, Nazareth, BE;
Jelle Vlassenbroek, Nieuwerkerken, BE;
Walter Schoenmaekers, Tielt-winge, BE;
Luc Van Hoorebeke, Ghent, BE;
Bert Masschaele, Kemmel, BE;
Veerle Cnudde, Nukerke, BE;
Manuel Dierick, Nazareth, BE;
Jelle Vlassenbroek, Nieuwerkerken, BE;
Sutor BVBA, Tielt-Winge, BE;
Abstract
The present invention relates to a characterization system () for characterizing an object () comprising a basic material and additional structural features. The system () comprises at least one irradiation source () for generating an irradiation beam for irradiating the object () to be characterized and at least one detector () for detecting said irradiation beam transmitted through the object (). The system () furthermore comprises a control means () for obtaining at least two different basic datasets of the object () for different configurations of the irradiation beam, the object () and the detector (). The latter may be obtained by shifting and/or rotating components and/or by selecting different components used for acquisition of the datasets. The system furthermore comprises an image processing means () for combining said at least two different basic datasets as to obtain a differential image indicating the additional structural features of the object () but substantially filtering out the basic material. The invention also relates to a corresponding method for characterizing objects and to an image processing means for processing acquired images accordingly.