The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2012

Filed:

Apr. 15, 2010
Applicants:

Naveen Chandra, Kenosha, WI (US);

Xiaoye Wu, Rexford, NY (US);

Thomas L. Toth, Brookfield, WI (US);

Jiang Hsieh, Brookfield, WI (US);

Inventors:

Naveen Chandra, Kenosha, WI (US);

Xiaoye Wu, Rexford, NY (US);

Thomas L. Toth, Brookfield, WI (US);

Jiang Hsieh, Brookfield, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A CT system includes a rotatable gantry having an opening for receiving an object to be scanned, and a controller configured to apply a first kVp for a first time period, apply a second kVp for a second time period, wherein the second time period is different from the first time period, acquire a first asymmetric view dataset during at least a portion of the first time period, acquire a second asymmetric view dataset during at least a portion of the second time period, and generate an image using the acquired first and second asymmetric view datasets.


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