The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2012

Filed:

Dec. 11, 2009
Applicants:

Thomas L. Toth, Brookfield, WI (US);

Jiang Hsieh, Brookfield, WI (US);

Naveen Chandra, Kenosha, WI (US);

Xiaoye Wu, Rexford, NY (US);

Inventors:

Thomas L. Toth, Brookfield, WI (US);

Jiang Hsieh, Brookfield, WI (US);

Naveen Chandra, Kenosha, WI (US);

Xiaoye Wu, Rexford, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); H05G 1/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

A CT system includes a rotatable gantry having an opening for receiving an object to be scanned, and a controller configured to obtain kVp projection data at a first kVp, obtain kVp projection data at a second kVp, extract data from the kVp projection data obtained at the second kVp, add the extracted data to the kVp projection data obtained at the first kVp to generate mitigated projection data at the first kVp, and generate an image using the mitigated projection data at the first kVp and using the projection data obtained at the second kVp.


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