The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2012
Filed:
Feb. 04, 2011
Dheerendra Kashyap, Overland Park, KS (US);
Craig Seyl, Olathe, KS (US);
Carl Mayer, Overland Park, KS (US);
John Ellenz, Olathe, KS (US);
Dheerendra Kashyap, Overland Park, KS (US);
Craig Seyl, Olathe, KS (US);
Carl Mayer, Overland Park, KS (US);
John Ellenz, Olathe, KS (US);
Revolutionary Business Concepts, Inc., Lenexa, KS (US);
Abstract
An apparatus and method for determining an analyte concentration of a sample, such as a tissue sample. The apparatus may comprise an emitter, close proximity detectors laterally located less than about 2 mm away from the emitter, and far away detectors laterally located greater than about 0.5 cm away from the emitter. A plurality of wavelengths may be sent from the emitter to the sample, reflected off of the sample, and received by the detectors. The reflectance value measured by the close proximity detectors may be used to calculate one or more scattering coefficients. The reflectance value measured by the far away detectors may be compared with a reflectance value calculated using the scattering coefficients in a numerical inversion of a diffusion model to determine the analyte concentration of the sample.