The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2012
Filed:
Jun. 29, 2009
Preston S. Baxter, Friendsville, TN (US);
Youe-tsyr Chu, Knoxville, TN (US);
Hossein M. Ghorashi, Knoxville, TN (US);
Michael E. Galyon, Knoxville, TN (US);
Preston S. Baxter, Friendsville, TN (US);
Youe-Tsyr Chu, Knoxville, TN (US);
Hossein M. Ghorashi, Knoxville, TN (US);
Michael E. Galyon, Knoxville, TN (US);
Uster Technologies AG, Uster, CH;
Abstract
A fiber instrument for measuring properties of a fiber sample, the fiber instrument having a surface for receiving the fiber sample, a hand for pressing the fiber sample against the surface, an illumination source for selectively illuminating the fiber sample with more than one peak wavelength, where each of the peak wavelengths is independently controllable as to an applied intensity of the peak wavelength, a sensor for capturing images of the fiber sample while it is illuminated, and a controller for controlling at least the sensor and the illumination source. By providing multiple peak wavelengths of illumination that are each independently controllable as to illumination intensity, the fiber instrument as described herein is better able to detect both foreign material within the fiber sample, and color gradations of the fiber sample.