The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2012
Filed:
Sep. 25, 2009
Eiji Ishiyama, Kurokawa-gun, JP;
Kouichi Yahagi, Kurokawa-gun, JP;
Tomonori Masuda, Kurokawa-gun, JP;
Eiji Ishiyama, Kurokawa-gun, JP;
Kouichi Yahagi, Kurokawa-gun, JP;
Tomonori Masuda, Kurokawa-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
A subject is imaged at a predetermined time interval by a plurality of imaging units which obtains a plurality of images having a parallax of a subject viewed from different viewpoints by imaging the subject from different viewpoints. An evaluation value which includes at least one of a luminance and a high frequency component of the images obtained by the imaging units at the predetermined time interval is calculated. When the evaluation value has changed by an amount exceeding a predetermined threshold value, the distance information calculation and three-dimensional processing on the plurality of images and object are performed. Here, a relative position of the object with respect to the three-dimensional image in a three-dimensional space is changed based on the distance information such that overlapping of the object and the three-dimensional image on top of each other is prevented when the three-dimensional display is performed.