The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2012
Filed:
Sep. 29, 2005
Werner Grömmer, Ortenburg/Kaltenöd, DE;
Felix Mednikov, Ortenburg, DE;
Robert Schmid, Neunkirchen am Brand, DE;
Martin Sellen, Ortenburg, DE;
Benno Weis, Hemhofen, DE;
Werner Grömmer, Ortenburg/Kaltenöd, DE;
Felix Mednikov, Ortenburg, DE;
Robert Schmid, Neunkirchen am Brand, DE;
Martin Sellen, Ortenburg, DE;
Benno Weis, Hemhofen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Micro-Epsilon Messtechnik GmbH & Co. KG, Ortenburg, DE;
Abstract
In one embodiment, a method for determining the distance of a conducting surface profiled in a direction of distance determination from a functional surface moving relative to the profiled surface is disclosed. The method includes connecting inputs of a sensor to an oscillator arrangement. The sensor includes a first and a second measuring coil. The method includes further connecting outputs of the sensor to an analog-to-digital converter via a demodulator unit to obtain first and second digital measured values. The first and second digital measured values correspond to the distance between the profiled surface and the first and second measuring coil of the sensor, respectively. The method further includes connecting an arithmetic unit to the analog converter unit. The second measurement coil is arranged at a known distance from the first measuring coil on the side of the first measuring coil that faces away from the profiled surface. The method finally includes calculating, using the first and second digital measured value and a reference digital value and the fixed distance, a distance measured value giving the distance of the functional surface from the profiled surface. The reference digital value corresponding to the measured value from a reference coil. The reference coil is assigned to the first and second measuring coils and the reference coil is located outside the range of influence of the profiled surface.