The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2012

Filed:

Apr. 06, 2009
Applicants:

Takao Kuwabara, Kanagawa, JP;

Nobuyuki Iwasaki, Kanagawa, JP;

Inventors:

Takao Kuwabara, Kanagawa, JP;

Nobuyuki Iwasaki, Kanagawa, JP;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01); H04N 9/64 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

An imaging system comprises: an imaging unit for producing an image within a given field of view; an image defect detector for detecting a defective area from a first image that is produced by the imaging unit without a subject in the given field of view; a size enlarging unit for forming a deemed defective area having an enlarged size consisting of pixels of the first image corresponding to a defective area detected by the image defect detector and at least one of pixels adjacent to these pixels; and an image defect correcting unit for correcting a second image produced by the imaging unit with a subject located within the given view of field according to a deemed defective area formed by the size enlarging unit.


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