The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2012
Filed:
Jun. 09, 2008
Applicants:
Amit Lal, Ithaca, NY (US);
Darius Paduch, Red Bank, NJ (US);
Ramkumar Abhishek, Ithaca, NY (US);
Peter Schlegel, Larchmont, NY (US);
Inventors:
Amit Lal, Ithaca, NY (US);
Darius Paduch, Red Bank, NJ (US);
Ramkumar Abhishek, Ithaca, NY (US);
Peter Schlegel, Larchmont, NY (US);
Assignee:
Cornell University, Ithaca, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/103 (2006.01); A61B 5/117 (2006.01);
U.S. Cl.
CPC ...
Abstract
Microprobes in various designs are provided including microprobes having a bulk base and a thin probe extending from the bulk base and a Wheatstone-bridge sensor circuit for measuring strain in the thin probe, and microprobes with two thin probes extending from the bulk base with their respective integrated Wheatstone-bridges to eliminate common mode forces experienced by the two thin probes.