The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2012
Filed:
Mar. 10, 2008
Lihong Pan, Brookfield, WI (US);
Feng Lin, Niskayuna, NY (US);
Lihong Pan, Brookfield, WI (US);
Feng Lin, Niskayuna, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A non-linear response may be measured by transmitting a first pulse at an amplitude and transmit frequency, using an aperture having N elements. A first response is measured at a sub-harmonic frequency based on the transmit frequency. At least second and third pulses are transmitted at the amplitude and transmit frequency. At least second and third responses are measured at the sub-harmonic frequency. The second and third pulses have the same phase with respect to each other and use first and second sub-apertures that have different ones of the N elements. A sum of the elements within the first and second sub-apertures is equal to N. Alternatively, at least two pulses having the same aperture and different amplitudes may be transmitted, and the responses measured at the sub-harmonic frequency. The responses are combined to suppress linear echoes and determine a non-linear response.