The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2012
Filed:
Mar. 19, 2009
Applicants:
Stefan Hain, Effeltrich, DE;
Hubert Mooshofer, Munich, DE;
Inventors:
Stefan Hain, Effeltrich, DE;
Hubert Mooshofer, Munich, DE;
Assignee:
Siemens Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/00 (2006.01); G01N 29/04 (2006.01); G01N 9/24 (2006.01); G01R 33/20 (2006.01); H02K 33/00 (2006.01); H02P 1/00 (2006.01); H02P 3/00 (2006.01); H02P 5/00 (2006.01); H02P 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
In a device and method for non-destructive materials testing with at least one ultrasonic transducer, the transducer is able to be moved by a movement system in at least one direction to a workpiece surface. The emission of ultrasonic by the ultrasonic transducer is able to be synchronized with the activation of the movement system so that electrical interference caused by the movement system occurs at times at which no echo is expected for ultrasonic emitted by the transducer. The method and device can be applied to non-destructive materials testing with ultrasound.