The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2012
Filed:
Aug. 16, 2010
Yao-te Cheng, Yonghe, TW;
Yin Yuen, San Francisco, CA (US);
Paul C. Hansen, Palo Alto, CA (US);
Yuzuru Takashima, Cupertino, CA (US);
Lambertus Hesselink, Atherton, CA (US);
Yao-Te Cheng, Yonghe, TW;
Yin Yuen, San Francisco, CA (US);
Paul C. Hansen, Palo Alto, CA (US);
Yuzuru Takashima, Cupertino, CA (US);
Lambertus Hesselink, Atherton, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Abstract
Transmission efficiency and/or spatial resolution provided by resonant apertures can be enhanced by disposing a tip on part of the screen that extends laterally into the aperture. For example, a tip disposed on the ridge of a C-shaped aperture can dramatically improve performance. A spatial resolution of λ/50 has been experimentally demonstrated with this approach. The combination of high spatial resolution and high transmission efficiency provided by this approach enables many applications, such as near field optical probes for near field scanning optical microscopy (NSOM). Another application is high resolution electron sources, where an photoelectron emitter can be disposed at or near a tip+aperture structure such that the high resolution optical near-field provides a correspondingly high resolution electron source.