The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2012

Filed:

Mar. 28, 2008
Applicants:

Mike Chow, Wappingers Falls, NY (US);

Rebecca Marie Gott, Poughkeepsie, NY (US);

Christopher Dao-ling Lei, Poughkeepsie, NY (US);

Naseer Shamsul Siddique, Poughkeepsie, NY (US);

Inventors:

Mike Chow, Wappingers Falls, NY (US);

Rebecca Marie Gott, Poughkeepsie, NY (US);

Christopher Dao-Ling Lei, Poughkeepsie, NY (US);

Naseer Shamsul Siddique, Poughkeepsie, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/00 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Real-time statistical analysis is used to perform autonomic self-healing within the context of a 3-tier regression system for analysis of a computer system design component. Throughout the system, there are mechanisms for implementing self-healing if breakage is detected. The regression layer with the highest throughput is maintained in a much cleaner state than otherwise, thereby creating a more efficient environment for identifying and removing defects in the design.


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