The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2012
Filed:
Feb. 11, 2010
Tung-yang Chen, Tainan County, TW;
Ching-ling Tsai, Tainan County, TW;
Sheng-fan Yang, Tainan County, TW;
Jui-ni Lee, Tainan County, TW;
Tung-Yang Chen, Tainan County, TW;
Ching-Ling Tsai, Tainan County, TW;
Sheng-Fan Yang, Tainan County, TW;
Jui-Ni Lee, Tainan County, TW;
Himax Technologies Limited, Fonghua Village, Xinshi Dist., Tainan, TW;
Abstract
A method for predicting and debugging electromagnetic interference (EMI) characteristics of an integrated circuit (IC) system includes the following steps: selecting a frequency domain range according to transformed raw data of the IC system to generate a blocking frequency analysis result, wherein the transformed raw data are transformed by a time-frequency waveform transformation; setting criteria data; comparing the blocking frequency analysis result with the criteria data to generate at least one comparison result; and generating a pass analysis report when a processing unit determines that each comparison result is passed; otherwise, executing an EMI design time-frequency analysis.