The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2012
Filed:
Apr. 24, 2009
Applicant:
David Alan Bayliss, Delray Beach, FL (US);
Inventor:
David Alan Bayliss, Delray Beach, FL (US);
Assignee:
LexisNexis Risk & Information Analytics Group Inc., Boca Raton, FL (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
Disclosed are systems for, and methods of, automatically detecting and treating field values of a particular field as null field values in records of a database. The system and method provide automatic treatment of these field values as null field values by calculating a critical frequency for the field. Based on the critical frequency of the field, the system and method treats field values that occur more than the critical frequency of the field as null field values and treats field values that occur less than the critical frequency as non-null field values.