The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2012

Filed:

Jan. 16, 2009
Applicants:

James Niemasik, San Francisco, CA (US);

Dileep George, Menlo Park, CA (US);

Inventors:

James Niemasik, San Francisco, CA (US);

Dileep George, Menlo Park, CA (US);

Assignee:

Numenta, Inc., Redwood City, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A HTM network that uses supervision signals such as indexes for correct categories of the input patterns to group the co-occurrences detected in the node. In the training mode, the supervised learning node receives the supervision signals in addition to the indexes or distributions from children nodes. The supervision signal is then used to assign the co-occurrences into groups. The groups include unique groups and nonunique groups. The co-occurrences in the unique group appear only when the input data represent certain category but not others. The nonunique groups include patterns that are shared by one or more categories. In an inference mode, the supervised learning node generates distributions over the groups created in the training mode. A top node of the HTM network generates an output based on the distributions generated by the supervised learning node.


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