The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2012

Filed:

Dec. 08, 2008
Applicants:

Devesh Mishra, Snoqualmie, WA (US);

Eric C. Young, Mercer Island, WA (US);

Sameer Vinod Shah, Seattle, WA (US);

Timothy Jesse Tien, Seattle, WA (US);

Jun Zhao, Bellevue, WA (US);

Inventors:

Devesh Mishra, Snoqualmie, WA (US);

Eric C. Young, Mercer Island, WA (US);

Sameer Vinod Shah, Seattle, WA (US);

Timothy Jesse Tien, Seattle, WA (US);

Jun Zhao, Bellevue, WA (US);

Assignee:

Amazon Technologies, Inc., Reno, NV (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed are various embodiments of a self healing andon system. One embodiment of the present disclosure includes a system comprising at least one server. The system further includes logic executed on the at least one server that retrieves a defect history associated with a vendor and at least one product from an inbound shipment from a memory. The at least one product is stocked in a materials handling facility, and the defect history is associated with a specified time period. The at least one server extracts at least one inventory defect from the defect history in a computer system and calculates an inventory defect rate. The at least one server imposes remedial measures if the inventory defect rate exceeds a specified threshold of the inventory defect rate.


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