The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2012
Filed:
Jan. 18, 2007
Hiroyuki Kawagishi, Yokohama, JP;
Hisashi Matsuda, Tokyo, JP;
Fumio Ootomo, Zama, JP;
Asako Inomata, Yokohama, JP;
Hiroyuki Kawagishi, Yokohama, JP;
Hisashi Matsuda, Tokyo, JP;
Fumio Ootomo, Zama, JP;
Asako Inomata, Yokohama, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
This invention provides an optimum value search apparatus, method, recording medium, and computer program product used in designing, analyzing, or testing a device having a plurality of factors that have effects on a characteristic. In this method, an orthogonal array is generated by setting level values obtained from the initial values of the factors to the coordinates of a two-dimensional table including a matrix of the characteristics and the factors. From the characteristics on the orthogonal array, characteristic values obtained on the basis of combinations of the level values of the factors of a single characteristic are grasped. A combination having a most excellent characteristic value is selected. The level values of the factors in the characteristic corresponding to the selected combination are reset in the orthogonal array. After resetting, processes are repeatedly executed to search for an optimum value as a most excellent one of the characteristic values.