The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2012
Filed:
Oct. 14, 2008
Simon Chen, San Jose, CA (US);
Jen-chan Chien, Saratoga, CA (US);
Hailin Jin, San Jose, CA (US);
Adobe Systems Incorporated, San Jose, CA (US);
Abstract
Methods and apparatus for matching image metadata to a profile database to determine image processing parameters are described. In embodiments, image metadata may be used to match input images against a profile database. For example, camera make and model information and/or lens make and model information may be retrieved from the image metadata corresponding to an input image and used to locate a best match profile in the profile database. Additional custom data may then be retrieved from the located profile to perform processing that may be optimized for a specific camera and lens that captured the images, and in some cases for particular camera settings. The profile database may be generated via a calibration process applied to each of a plurality of camera/lens combinations. In one embodiment, the additional custom data may be adjusted or scaled to account for differences in cameras, lenses, or settings.