The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2012
Filed:
Feb. 04, 2010
Adam S. Wang, Stanford, CA (US);
Norbert J. Pelc, Los Altos, CA (US);
Adam S. Wang, Stanford, CA (US);
Norbert J. Pelc, Los Altos, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Abstract
A method for determining a composition of an object using a spectral x-ray system is provided. X-ray photons of at least two different energies are transmitted through the object. The energy of each detected x-ray photon using a detector in the x-ray system is estimated. A first weighted sum of the number of detected photons of each energy is found using a first weighting function, wherein the first weighting function is dependent on the attenuation coefficient function of a first material. In another embodiment, the photons are binned into two energy bins wherein there is a gap between the energy bins.