The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8194338 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 05, 2012

Filed:

Mar. 31, 2010
Applicant:

Baoliang Zhang, Foothill Ranch, CA (US);

Inventor:

Baoliang Zhang, Foothill Ranch, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 27/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for performing a defect scan of a disk are provided. In one embodiment, a disk drive comprising a disk, a head configured to read an area of the disk to generate a read signal, and read channel circuitry configured to receive the read signal from the head, perform channel statistic measurements on the read signal, and to generate a Channel Statistic Metric (CSM) flag based on the channel statistic measurements. The disk drive further comprises defect scan circuitry configured to receive the CSM flag from the read channel circuitry, to accumulate the CSM flag to obtain an accumulated CSM flag value and to detect a defect area on the disk based on the accumulated CSM flag value.


Find Patent Forward Citations

Zhang, Baoliang. (2012). Parallel media defect scan in sector read (U.S. Patent No. 8194338). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8194338

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…