The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2012

Filed:

Jul. 28, 2009
Applicants:

Tokihiro Kosaka, Kakogawa, JP;

Koichi Okubo, Kobe, JP;

Inventors:

Tokihiro Kosaka, Kakogawa, JP;

Koichi Okubo, Kobe, JP;

Assignee:

Sysmex Corporation, Kobe, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 21/01 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is to present a sample analyzer, comprising: an imaging device for imaging a sample container which has translucency and contains a sample; a measuring device for aspirating the sample contained in the sample container and measuring the aspirated sample; a transporting device for transporting the sample container to a supply position for supplying the sample contained in the sample container to the measuring device; a sample volume obtainer for obtaining sample volume information relating to volume of the sample in the sample container, based on an image obtained by imaging the sample container by the imaging device; and a transport controller for controlling the transporting device to perform a transport operation in accordance with the sample volume information obtained by the sample volume obtainer.


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